Reliability testing by precise electrical measurement
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 369-373
- https://doi.org/10.1109/test.1988.207823
Abstract
Many of the mechanisms that lead to the ultimate failure of an integrated circuit may be evident early in the life of a device and should be detectable if sufficiently precise electrical measurements are made. A variety of tests have been made on medium scale CMOS circuits to evaluate this hypothesis. These have included leakage current, transient current, electrical noise, upper cut off frequency and delay times. The devices under test have been stressed to accelerate ageing and the results of the diagnostic electrical measurements correlated with subsequent failure. Consideration has been given to the implementation of the reliability tests in conjunction with the normal functional testing.Keywords
This publication has 1 reference indexed in Scilit:
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