Rapid nondestructive method for measuring the refractive index and thickness of thin dielectric films
- 1 January 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (1) , 48-50
- https://doi.org/10.1088/0022-3735/6/1/022
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Influence of Absorption on Measurement of Refractive Index of FilmsApplied Optics, 1965
- Optical Constants of Silicon in the Region 1 to 10 evPhysical Review B, 1960
- Measurement of Refractive Index of a Transparent Film on a Reflecting SubstrateOptica Acta: International Journal of Optics, 1959
- Brewster Angle Apparatus for Thin Film Index MeasurementsJournal of the Optical Society of America, 1957