Direct measurement of spectral emissivity of liquid Si in the range of visible light
- 10 July 1995
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 67 (2) , 152-154
- https://doi.org/10.1063/1.114650
Abstract
Normal spectral emissivity of liquid Si was determined by direct measurement of thermal radiations from a surface of the Si melt and a blackbody cavity. The spectral emissivity has little dependence on the wavelength. The emissivity is 0.27 for the wavelength from 500 to 800 nm and is about a half of that of solid silicon at the melting point. Temperature dependence of the emissivity is very small in the temperature range from the melting point to 1550 °C. Free‐electron model with a plasma frequency and relaxation time of the order of 1016 Hz gives a good agreement with the experimental result. That indicates the dominant effect of the free electrons on the optical properties of the liquid Si.Keywords
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