High Dispersion Electron Diffraction by Primary Magnification
- 1 December 1945
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 16 (12) , 832-836
- https://doi.org/10.1063/1.1707547
Abstract
A method for attaining high dispersion in electron diffraction is presented. High dispersion may be obtained by primary magnification of a diffraction pattern formed in the normal manner at the object plane of a magnetic or electrostatic lens. Dispersion may be varied continuously by changing the lens current or voltage. The design of diffraction cameras of this type is discussed and their value in diffraction problems pointed out. The validity of the method is established by diffraction patterns obtained using a modified electron microscope adapter.This publication has 3 references indexed in Scilit:
- X-Ray Diffraction Studies on Protein Fibers. I. The Large Fiber-Axis Period of CollagenJournal of the American Chemical Society, 1944
- LOW ANGLE X-RAY SCATTERING FROM CHRYSOTILESJournal of the American Chemical Society, 1944
- A Diffraction Adapter for the Electron MicroscopeJournal of Applied Physics, 1942