Transepithelial electrical resistance and tight junctions of human gingival keratinocvtes

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Abstract
Human gingival keratinocytes (HGKs) were studied by means of freeze-fracture technique, conventional electron microscopy and the transepithelial electrical resistance for the investigation of intercellular contacts. For the purpose of comparison, MDCK cells and HaCat cells were also included. An unexpected finding was the presence of tight junctions in the HGKs. In vivo the tight junctions, which were of low complexity and P-face-associated, were co-distributed with desmosomes; in one case, the strands ran directly through desmosomal plaques. Where tight junctions and desmosomes occurred together, no gap junctions were seen. In contrast, where no tight junctions were present, gap junctions and desmosomes were co-localized. However, the unfavourable fracture planes through the tissue did not allow a clearcut allocation of gap junction/tight junction occurrence to certain strata. In vitro, HGKs also expressed tight junctions which formed networks of low complexity and high P-face association. Whereas desmosomes were highly expressed, gap junctions were not observed in cultured keratinocytes. Transepithelial electrical resistances (TEER) of cultured HGKs were higher than the values in low resistance-MDCK cells and HaCat cells but considerably lower than the values in high resistance MDCK cells, supporting the fundamental correlation between tight junction morphology and TEER. The results with this cell culture model of the human gingiva provide some valuable information about in vitro differentation and concommittent changes in cellular contacts of human gingival keratinocytes.