Ellipsometry and reflectivity at the Brewster angle: tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 234 (1-2) , 471-474
- https://doi.org/10.1016/0040-6090(93)90310-l
Abstract
No abstract availableKeywords
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