A microcomputer-controlled Guinier-Lenne-type dynamic-temperature X-ray diffraction camera
- 1 December 1985
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 18 (12) , 1054-1057
- https://doi.org/10.1088/0022-3735/18/12/012
Abstract
Dynamic-temperature X-ray diffractions is an important tool for investigating the structural changes occurring in a material as a function of temperature. A modified Guinier-Lenne high-temperature camera for carrying out dynamic-temperature X-ray diffraction is described. In order to facilitate a sample change, the sample holder is redesigned. The use of a conventional microcomputer for controlling and regulating the temperature at the sample is discussed. A software program packet for running up to ten time-temperature cycles with rates of 0.01 to 100K min-1 is given.Keywords
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