Methodology for accurate free-space characterisation of radar absorbing materials

Abstract
Although it is now some 50 years since the first practical application of radar absorbing materials (RAM), there does not seem to have been a comprehensive discussion in the literature of the optimum methodology for characterising such materials using free-space methods, the sources of error that arise in a typical laboratory measurement facility and, perhaps most important of all, an estimate of the measurement uncertainties. A previous paper started to address these problems by discussing calibration techniques for a vector network analyser system used for making complex reflectivity measurements on RAM. It is the aim of this paper to extend the discussion to include the use of a scalar measurement system (since these are still in common use), the factors affecting the design of a free-space reflectivity arch and the verification of measured reflectivity data.

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