Flaw Visibility Enhancement by Split-Spectrum Processing Techniques

Publisher Website

1 January 1981

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 878-883
https://doi.org/10.1109/ultsym.1981.197750

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Flaw-to-grain echo enhancement by split-spectrum processing
Ultrasonics, 1982
Evaluation of a Random Signal Correlation System for Ultrasonic Flaw Detection
IEEE Transactions on Sonics and Ultrasonics, 1976
A Quantitative Analysis of Sea Clutter Decorrelation with Frequency Agility
IEEE Transactions on Aerospace and Electronic Systems, 1968