Theory of magnetic imaging by STM force microscopy (invited) (abstract)
- 15 April 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (8) , 2947
- https://doi.org/10.1063/1.340910
Abstract
Recently, we have proposed1 a new method to obtain information about local surface magnetic properties, based on the idea of measuring magnetic forces with an STM force microscope.2 In this work, we present a theoretical analysis of the magnetic topography as despicted by this magnetic force microscope (MFM). In order to study the resolution and practical limits of this new technique, we simulate MFM results for different magnetic configurations. The influence of surface roughness on the magnetic resolution is also discussed. We show that lateral resolutions of 0.01 μm can be achieved with this technique. Recent MFM experiments are also analyzed.This publication has 3 references indexed in Scilit:
- Observation of magnetic forces by the atomic force microscopeJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983