Phonon contributions to photohole linewidths observed for surface states on copper
- 15 November 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 54 (20) , 14807-14811
- https://doi.org/10.1103/physrevb.54.14807
Abstract
We have observed the linear temperature dependence of the linewidth of surface states on Cu. These data allow the determination of a temperature coefficient for the phonon-hole coupling, which enters the linewidth as Γ=2π. For the s,p-like (Shockley) state at Γ¯ on Cu(111), we find b=0.137±0.015, in perfect agreement with earlier data of McDougall, Balasubramian, and Jensen [Phys. Rev. B 51, 13 891 (1995)]. The d-like (Tamm) state at M¯ on Cu(111) is characterized by a different b=0.085±0.015, which, however, agrees with the b=0.09±0.02 observed for a similar Tamm state on Cu(100). We suggest that the different spatial extent of the surface states is responsible for the different phonon-hole coupling. © 1996 The American Physical Society.
Keywords
This publication has 25 references indexed in Scilit:
- Upper limits for d-hole inverse lifetimes in copperSolid State Communications, 1994
- Angle-resolved photoemission from Cu(001): Influence of angular resolution on line-widthsSolid State Communications, 1994
- Influence of electron-phonon interactions on angle-resolved photoelectron spectra from metalsSurface Science, 1993
- Anomalous virtual bound state width in photoemission from Pt impurities on Ag(110)Physical Review Letters, 1993
- High-resolution photoemission study of the low-energy excitations in 4f-electron systemsPhysical Review B, 1990
- Different core-hole lifetime and screening in the surface of W(110)Physical Review Letters, 1989
- Vibrational broadening in core-level spectra from adsorbates: C, N and O on Ni(100)Physical Review Letters, 1989
- Nonlifetime effects in photoemission linewidthsPhysical Review B, 1983
- Surface-atom x-ray photoemission from clean metals: Cu, Ag, and AuPhysical Review B, 1983
- Evidence for a New Broadening Mechanism in Angle-Resolved Photoemission from Cu(111)Physical Review Letters, 1983