Defect detection in textured materials by optical filtering with structured detectors and self‐adaptable masks
- 1 March 1996
- journal article
- Published by SPIE-Intl Soc Optical Eng in Optical Engineering
- Vol. 35 (3) , 838-844
- https://doi.org/10.1117/1.600663
Abstract
An optical method using Fourier transformation and spatial filtering is used to reveal defects in textured materials in real time. New optical structured filter types were developed including a self‐adaptable mask made of photochromic polymers. The characteristics of these materials make possible very promising applications in pattern recognition such as that represented by a fabric. © 1996 Society of Photo−Optical Instrumentation Engineers.Keywords
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