Single-layer antireflection coatings on absorbing substrates for the parallel and perpendicular polarizations at oblique incidence
- 15 February 1985
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 24 (4) , 513-518
- https://doi.org/10.1364/ao.24.000513
Abstract
Explicit equations are derived that determine the refractive index of a single layer that suppresses the reflection of p- or s -polarized light from the planar interface between a transparent and an absorbing medium at any given angle of incidence. The required layer thickness and the system reflectance for the orthogonal unextinguished polarization also follow explicitly. This generalizes earlier work that was limited to normal incidence or to oblique incidence at dielectric–dielectric interfaces. Specific examples are given of p- and s -antireflection layers on Si and Al substrates at λ = 6328 Å at various angles of incidence.Keywords
This publication has 12 references indexed in Scilit:
- Zero reflection from a dielectric film on metal substrate at oblique angles of incidenceApplied Optics, 1984
- Pseudo-Brewster and second-Brewster angles of an absorbing substrate coated by a transparent thin filmApplied Optics, 1983
- Characterization of optical thin filmsApplied Optics, 1979
- Study of Al with a combined Auger electron spectrometer–ellipsometer systemJournal of Vacuum Science and Technology, 1976
- Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*Journal of the Optical Society of America, 1975
- Reflection Polarization by a Transparent-Film–Absorbing-Substrate SystemJournal of the Optical Society of America, 1972
- Mirror Coatings for Low Visible and High Infrared Reflectance*Journal of the Optical Society of America, 1956
- On a Method of Decreasing the Reflection from Nonmetallic SubstancesJournal of the Optical Society of America, 1936