Electronic speckle pattern interferometric system based on a speckle reference beam

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Abstract
A new electronic speckle pattern interferometric (ESPI) technique is introduced. The technique is based on a reference beam combined with a large aperture optical system. The basic principles are described and compared with conventional ESPI setups. The new interferometer is easy to adjust, it is invulnerable to dust and scratches on the optical components, and is very compact. It is well-suited for practical engineering applications. Light sensitivity and fringe quality are comparable with the conventional ESPI features. Superior fringe pattern can be obtained by use of a new speckle reduction technique to be described.