Atomic force microscopy of layered compounds
- 1 July 1989
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 7 (4) , 2879-2881
- https://doi.org/10.1116/1.576162
Abstract
Physical properties of lamellar solid surfaces have been investigated by means of atomic force microscopy (AFM) with nanometer resolution. The effects of contact forces from 10−7 N to 10−5 N have been studied. The role of frictional forces was noted. Surface modifications caused by a probe exerting up to 10−5 N on muscovite and selenite samples were observed. The materials included in this study were muscovite, selenite, graphite, and molybdenite; a unique set, offering a wide range of material properties. These lamellar materials were chosen to explore the applicability of the AFM technique for investigations of surface forces.Keywords
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