Measurements of time-domain voltage/current waveforms at RF and microwave frequencies based on the use of a vector network analyzer for the characterization of nonlinear devices-application to high-efficiency power amplifiers and frequency-multipliers optimization
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 47 (5) , 1259-1264
- https://doi.org/10.1109/19.746594
Abstract
International audienceA new time-domain waveform measurement system based on the combination of an harmonic source and load-pull setup with a modified vector network analyzer (VNA) is presented. It allows the visualization, the measurement, and the optimization of high-frequency currents and voltages at both ports of nonlinear microwave devices. Measurements of GaAs field effect transistor (FET's) and GaInP/GaAs heterojunction bipolar transistor (HBT's) at L-band were performed to demonstrate the great capabilities of the system. On one hand, voltage and current waveforms at both ports of transistors, working as power amplifiers, were optimized for maximum power-added efficiency. On the other hand, time-domain waveforms of transistors operating as frequency multipliers were optimized for maximum conversion gain. Such results prove the capabilities offered by this new nonlinear time-domain measurement system to aid in designing optimized power amplifiers or frequency multipliers. They also provide valuable information for nonlinear transistor model validatioKeywords
This publication has 8 references indexed in Scilit:
- A new on-wafer large-signal waveform measurement system with 40 GHz harmonic bandwidthPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave devicePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A novel computerized multiharmonic active load-pull system for the optimization of high efficiency operating classes in power transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniquesIEEE Transactions on Microwave Theory and Techniques, 1998
- Internal-node waveform analysis of MMIC power amplifiersIEEE Transactions on Microwave Theory and Techniques, 1995
- Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedureIEEE Transactions on Instrumentation and Measurement, 1994
- An improved calibration technique for on-wafer large-signal transistor characterizationIEEE Transactions on Instrumentation and Measurement, 1993
- High-frequency periodic time-domain waveform measurement systemIEEE Transactions on Microwave Theory and Techniques, 1988