An automatic program suitable for on-wafer characterization and statistic analysis of microwave devices
- 22 June 2004
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A macro program based on Agilent IC-CAP software is developed for on-wafer characterization and statistic analysis of microwave devices. With the perfect combination of Cascade Nucleus software and the IC-CAP GUI (Graphical User Interface) technique in our program, multi-die, multi-type devices characterization and statistic analysis can be easily achieved to get the quantification information that is very important for device engineers, modeling engineers and circuit designers. Furthermore, automatic moving and probing can dramatically improve the measurement accuracy by eliminate the measurement error due to probing condition variation.Keywords
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