Fourier transform Raman spectroscopy in an industrial environment
- 30 April 1990
- journal article
- review article
- Published by Elsevier in TrAC Trends in Analytical Chemistry
- Vol. 9 (4) , 119-127
- https://doi.org/10.1016/0165-9936(90)87105-u
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Near-Infrared Raman Spectroscopy with a 783-nm Diode Laser and CCD Array DetectorApplied Spectroscopy, 1989
- Raman spectroscopyAnalytical Chemistry, 1988
- Fluorescence rejection in Raman spectroscopy using a gated intensified diode array detectorJournal of Raman Spectroscopy, 1986
- Raman spectroscopyAnalytical Chemistry, 1986
- FT-Raman Spectroscopy: Development and JustificationApplied Spectroscopy, 1986
- The use of 752.5 and 799.3 nm laser excitation in Raman spectroscopyOptics & Laser Technology, 1985
- Surface-enhanced resonance Raman spectroscopy of Rhodamine 6G adsorbed on colloidal silverThe Journal of Physical Chemistry, 1984
- Fluorescence-free resonance Raman spectra of reduced nicotinamide adenine dinucleotide via ultraviolet excitationJournal of Raman Spectroscopy, 1980
- New developments in interference spectroscopyReports on Progress in Physics, 1960
- I. — les principes généraux des méthodes nouvelles en spectroscopie interférentielle - A propos de la théorie du spectromètre interférentiel multiplexJournal de Physique et le Radium, 1958