Microcomputer reliability improvement using triple-modular redundancy
- 1 June 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 64 (6) , 889-895
- https://doi.org/10.1109/proc.1976.10239
Abstract
Triple-modular redundancy (TMR) is a classical technique for improving the reliability of digital systems. However, applying TMR to microcomputer systems may not improve overall system reliability because voter circuits may contribute as much to system unreliability as the microprocessors themselves. We examine the issues that affect the effectiveness of TMR for transient recovery and the reliability of semiconductor memory systems. With careful application, TMR can improve the mission time of a small system by a factor of 3 or more.Keywords
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