Single trial visual event-related potential EEG analysis using the wavelet transform
- 20 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2, 947
- https://doi.org/10.1109/iembs.1999.804101
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- De-noising by soft-thresholdingIEEE Transactions on Information Theory, 1995