High-energy resolution in X-ray scattering with the spectrometer INELAX. I. The principles and the test instrument

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Abstract
Very high-energy resolution measurements using X-rays can be achieved by extreme backreflection (Bragg angle close to 90°) from perfect crystals. This technique, combined with the high intensity of X-rays emitted by synchrotron-radiation sources, allowed the development of the instrument INELAX for inelastic scattering experiments. The principles and test results are discussed.