Growth of surface films on silver

This publication has 10 references indexed in Scilit:

• The Prism-Substrate: a New Tool for Determining an Angle of Incidence
  Applied Optics, 1968
• A Comparative Study of Adsorption by Ellipsometric and Radiotracer Methods
  The Journal of Physical Chemistry, 1966
• Bowl Feed Technique for Producing Supersmooth Optical Surfaces
  Applied Optics, 1966
• Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
  Applied Optics, 1966
• The influence of surface structure on a tarnishing reaction
  Philosophical Magazine, 1964
• A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
  Published by National Institute of Standards and Technology (NIST) ,1964
• Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry
  Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
• Determination of the Properties of Films on Silicon by the Method of Ellipsometry
  Journal of the Optical Society of America, 1962
• Surface Plasma Oscillations of a Degenerate Electron Gas
  Physical Review B, 1960
• Adsorption of Gases in Multimolecular Layers
  Journal of the American Chemical Society, 1938