Investigation of Grain‐Boundary Segregation in Ceramic Oxides by Analytical Scanning Transmission Electron Microscopy
- 1 September 1980
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 63 (9-10) , 542-546
- https://doi.org/10.1111/j.1151-2916.1980.tb10761.x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Absorption Effects in STEM Microanalysis of Ceramic OxidesJournal of the American Ceramic Society, 1980
- Boundary segregation of Ca, Fe, La and Si in magnesium oxideJournal of Materials Science, 1979
- Principles of Thin Film X-Ray MicroanalysisPublished by Springer Nature ,1979
- Grain boundary segregation in ceramicsMetallurgical Transactions A, 1977
- Segregation to interfacesInternational Materials Reviews, 1977
- Grain boundary segregation and sintering in aluminaMaterials Chemistry, 1976
- Quantitative X-ray energy dispersive analysis with the transmission electron microscopeX-Ray Spectrometry, 1975
- Practical Scanning Electron MicroscopyPublished by Springer Nature ,1975
- Plausible Concepts Necessary and Sufficient for Interpretation of Ceramic Grain‐Boundary Phenomena: I, Grain‐Boundary Characteristics, Structure, and Electrostatic PotentialJournal of the American Ceramic Society, 1974
- Electrical Conductivities and Defect Structures of Pure NiO and Chromium-Doped NiOZeitschrift für Physikalische Chemie, 1971