New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems
- 24 July 1998
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 3336, 45-56
- https://doi.org/10.1117/12.317049
Abstract
A new 17' X 17' immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide/Amorphous Silicon based technology, and give measurement results (MTF, DQE stability). We compare the new detector performance to existing technologies (film/screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI/a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. . .) which have been up to now done using films.This publication has 0 references indexed in Scilit: