An approach estimating the number of domain walls and eddy current losses in grain-oriented 3% Si-Fe tape wound cores
- 1 July 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 16 (4) , 569-572
- https://doi.org/10.1109/tmag.1980.1060653
Abstract
A method is presented for estimating the number of domain walls in grain-oriented 3% Si-Fe tape wound cores under sinusoidal flux conditions by extending the method developed in a study of the dynamic behavior of 50% Ni-Fe square-loop cores. The results show that the number of domain walls increases approximately with exciting frequency asf^{0.4 \\sim 0.5}. The calculated eddy current loss based on the modified Pry and Bean equation and the obtained number of domain walls agree well with the measured loss.Keywords
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