Resonant Polaron Coupling of High Index Electron Landau Levels in GaAs Heterostructures
- 11 March 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 76 (11) , 1904-1907
- https://doi.org/10.1103/physrevlett.76.1904
Abstract
The resonant polaron coupling of high index Landau levels was investigated for quasi-two-dimensional electron inversion layers in GaAs. Strong polaron mass enhancements were observed in magnetic field regimes where the Landau levels and 3 cross with the level plus one bulk longitudinal optical phonon. The polaron masses were excellently described with a Fröhlich coupling constant to 0.07 taking into account band coupling phenomena, a finite extent of the inversion layer in growth direction, and coupling of the electrical dipole transitions between the Landau levels due to electron-electron interactions.
Keywords
This publication has 21 references indexed in Scilit:
- Carrier-concentration-dependent polaron cyclotron resonance in GaAs heterostructuresPhysical Review B, 1992
- Polaron cyclotron mass in GaAs/AlxGa1−xAs heterostructuresSurface Science, 1988
- Effect of dynamical screening on the polaron cyclotron-resonance mass of a two-dimensional electron gas in GaAs-As heterostructuresPhysical Review B, 1987
- Electron-phonon interaction effects in a quasi-two-dimensional electron gas in the GaAs-As heterostructurePhysical Review B, 1987
- Optical phonon interaction effects in layered semiconductor structuresAnnals of Physics, 1985
- Analysis of polaron effects in the cyclotron resonance ofn-GaAs and AlGaAs-GaAs heterojunctionsPhysical Review B, 1985
- Resonant polarons in a GaAs-GaAlAs heterostructureSolid State Communications, 1985
- Cyclotron resonance of polarons confined to a surfacePhysical Review B, 1984
- Theory of Two-Dimensional MagnetopolaronsPhysical Review Letters, 1984
- Polaron effective mass in GaAs heterostructurePhysical Review B, 1983