Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals
- 1 May 2004
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 455-456, 596-600
- https://doi.org/10.1016/j.tsf.2004.01.031
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Determination of the Anisotropic Refractive Indices of Twisted Nematic Liquid Crystals by Means of Renormalized Transmission EllipsometryJapanese Journal of Applied Physics, 2002
- Determination of Director Distributions in Liquid Crystal Polymer-Films by Means of Generalized Anisotropic EllipsometryJapanese Journal of Applied Physics, 2000
- Characterization of biaxially-stretched plastic films by generalized ellipsometryThin Solid Films, 1998
- Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystalsJournal of the Optical Society of America A, 1996