Surface quantitative analysis of Cr?O systems by XPS
- 1 August 1983
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 5 (4) , 173-176
- https://doi.org/10.1002/sia.740050410
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Examination by ESCA of the Constitution and Effects on Lacquer Adhesion of Passivation Films on TinplateBritish Corrosion Journal, 1979
- The Physical Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron SpectroscopyPublished by ASTM International ,1978