Distance checking algorithms
- 31 December 1979
- journal article
- Published by Elsevier in Computer Graphics and Image Processing
- Vol. 11 (4) , 349-376
- https://doi.org/10.1016/0146-664x(79)90070-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Automatic detection of semiconductor mask defectsMicroelectronics Reliability, 1976
- Defect detection in complicated patternsElectrical Engineering in Japan, 1975
- A process for detecting defects in complicated patternsComputer Graphics and Image Processing, 1973
- Local Properties of Binary Images in Two DimensionsIEEE Transactions on Computers, 1971