Gradually-on structure for scan design
- 23 April 1992
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 28 (9) , 868-870
- https://doi.org/10.1049/el:19920548
Abstract
A new structure named the gradually-on (GO) structure for the full/partial scan design of sequential circuits is proposed. Because this structure allows the scan cells to be turned on gradually, the total test application time can be dramatically reduced.Keywords
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