Comparison between XAFS experiments and multiple-scattering calculations in silicon and zincblende
- 1 June 1989
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 158 (1-3) , 347-350
- https://doi.org/10.1016/0921-4526(89)90308-6
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Multiple-scattering effects in theK-edge x-ray-absorption near-edge structure of crystalline and amorphous siliconPhysical Review B, 1987
- Spherical wave exafs analysis of the silicon K-edge X-ray absorption spectrumSolid State Communications, 1987
- Explicit local exchange-correlation potentialsJournal of Physics C: Solid State Physics, 1971
- The Scattering of Slow Electrons by Hydrogen MoleculesJournal of the Physics Society Japan, 1967