The quantitative analysis of thin specimens
- 1 March 1975
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 103 (2) , 203-207
- https://doi.org/10.1111/j.1365-2818.1975.tb03895.x
Abstract
SUMMARY: Results are reported concerning the use of an energy dispersive X‐ray detector to carry out the analysis of thin foils in the electron microscope. The combination of a thin specimen and the extreme stability of the energy dispersive X‐ray detector enables the experimental determination of a calibration curve of X‐ray production—detection efficiency vs characteristic X‐ray energy. Quantitative analysis can be carried out using the calibration curve without reference to standards at the time of analysis.Keywords
This publication has 2 references indexed in Scilit:
- An investigation of manganese partitioning during the austenite-pearlite transformation using analltical electron microscoplActa Metallurgica, 1974
- The use of the analytical electron microscope EMMA-4 to study the solute distribution in thin foils: some applications to metals and mineralsJournal of Microscopy, 1973