Electron diffraction based techniques in scanning electron microscopy of bulk materials
- 1 August 1997
- Vol. 28 (4) , 279-308
- https://doi.org/10.1016/s0968-4328(97)00032-2
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- Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)Philosophical Magazine Letters, 1997
- Examination of fatigue crack plastic zones using scanning-electron-microscope-based electron diffraction techniquesPhilosophical Magazine Letters, 1996
- Observation of strain distributions in partially relaxed In0.2Ga0.8As on GaAs using electron channelling contrast imagingPhilosophical Magazine Letters, 1996
- The deformation behaviour of grain boundary regions in polycrystalline aluminiumPhilosophical Magazine A, 1996
- The effects of surface stress relaxation on electron channelling contrast images of dislocationsPhilosophical Magazine A, 1995
- A channel plate detector for electron backscatter diffractionReview of Scientific Instruments, 1995
- Zone-axis back-scattered electron contrast for fast electronsPhilosophical Magazine A, 1994
- Electron channelling contrast imaging of interfacial defects in strained silicon-germanium layers on siliconPhilosophical Magazine A, 1993
- Development of grain misorientation texture, in terms of coincident site lattice structures, as a function of thermomechanical treatmentsPhilosophical Magazine A, 1989
- The effects of strain on grain misorientation texture during the grain growth incubation periodPhilosophical Magazine A, 1988