A New Approach Towards Property Nanomeasurements Using In Situ TEM
- 1 January 1999
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Characterization of Nanophase MaterialsPublished by Wiley ,1999
- Electrostatic Deflections and Electromechanical Resonances of Carbon NanotubesScience, 1999
- Carbon Nanotube Quantum ResistorsScience, 1998
- Aligned Carbon Nanotube Films: Production and Optical and Electronic PropertiesScience, 1995