Errors in testing
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1018-1027
- https://doi.org/10.1109/test.1990.114125
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- IC quality and test transparencyIEEE Transactions on Industrial Electronics, 1989