Electrical and photoelectrical properties of MIS structures with rare earth oxide films as insulator
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 552-555
- https://doi.org/10.1109/icsd.1995.523047
Abstract
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This publication has 1 reference indexed in Scilit:
- Photoemission of Electrons from Silicon into Silicon Dioxide. Effects of Ion Migration in the OxideJournal of Applied Physics, 1966