A Guinier Diffractometer with a Scanning Position Sensitive Detector
- 1 January 1981
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 25, 315-324
- https://doi.org/10.1154/s0376030800009927
Abstract
A strictly focussing Guinier diffractometer using a linear position-sensitive proportional counter (PSPC) to detect the diffracted x-rays is described. The data collection time for a complete pattern can so be reduced to minutes Instead of hours as it used to be in conventional film- or counter-Guinier systems. The PSPC collects all diffracted x-rays over several degrees of 2 Theta in parallel and composes the full pattern by a continuous scan over the whole 2 Theta range. This principle was described in Adv. In X-Ray Anal. Vol. 22, 255 ff and 24, 123 ff. for Bragg-Brentano diffractometers.Keywords
This publication has 1 reference indexed in Scilit:
- Guinier camera for single crystal investigationJournal of Applied Crystallography, 1972