An Accurate FET Modelling from Measured S-Parameters
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86, 377-380
- https://doi.org/10.1109/mwsym.1986.1132197
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Self-Consistent FET Models for Amplifier Design and Device DiagnosticsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Determination of the Basic Device Parameters of a GaAs MESFETBell System Technical Journal, 1979