Local Atomic Structure of a Clean Surface by Surface Extended X-Ray Absorption Fine Structure: Amorphized Si
- 14 January 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 54 (2) , 122-125
- https://doi.org/10.1103/physrevlett.54.122
Abstract
The application of near-edge, surface, extended x-ray absorption fine structure to the study of a clean surface is reported. Direct evidence is found for surface recrystallization of ion-damaged (amorphized) Si, whereas no such evidence is seen for evaporated (amorphous) Si. The procedures described here are applicable to almost all clean or adsorbate-covered surfaces.Keywords
This publication has 11 references indexed in Scilit:
- Direct structural study of Cl on Si {111} and Ge {111} surfaces: New conclusionsPhysical Review B, 1983
- Incipient amorphous-to-crystalline transition in GePhysical Review B, 1983
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981
- Orientation of Chemisorbed Molecules from Surface-Absorption Fine-Structure Measurements: CO and NO on Ni(100)Physical Review Letters, 1981
- EXAFS investigation of amorphous-to-crystal transition in GeSolid State Communications, 1981
- Adsorption Sites and Bond Lengths of Iodine on Cu{111} and Cu{100} from Surface Extended X-Ray-Absorption Fine StructurePhysical Review Letters, 1980
- Bonding of Oxygen on Al(111): A Surface Extended X-Ray Absorption Fine-Structure StudyPhysical Review Letters, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Core-Level Binding Energy and Density of States from the Surface Atoms of GoldPhysical Review Letters, 1978
- Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)Physical Review Letters, 1978