Precision of PIXE analysis of thin fluid-residue specimens using internal standards
- 1 February 1985
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 6 (3) , 551-557
- https://doi.org/10.1016/0168-583x(85)90017-5
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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