A Method of Correcting for Incident Ion Buildup Effects in Measurements of Thick Target X-Ray Yields from Ion-Atom Collisions
- 1 July 1971
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 42 (7) , 1072-1073
- https://doi.org/10.1063/1.1685285
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- X-Ray Production in Ion-Atom Collisions: The Influence of Level MatchingPhysical Review Letters, 1970
- Cross sections for Ar L-shell and Ne K-shell x-ray emission in heavy ion-atom collisionsPhysica, 1970
- Excitation of and X-Ray Lines by 70-400-keV , , , , and IonsPhysical Review A, 1970
- Cross Sections for Inner-Shell Vacancy Production in Ion-Atom CollisionsPhysical Review Letters, 1970
- Pauli Excitation of Atoms in CollisionPhysical Review Letters, 1970
- X-Ray Production in- C Collisions in the Energy Range 20 keV to 1.5 MeVPhysical Review B, 1969