Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids
- 1 April 1984
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 55 (4) , 610-613
- https://doi.org/10.1063/1.1137766
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Transient hot-strip probe for measuring thermal properties of insulating solids and liquidsReview of Scientific Instruments, 1983
- Transient hot-strip method for measuring thermal conductivity and specific heat of solids and fluids: Second order theory and approximations for short timesJournal of Applied Physics, 1982
- Simultaneous measurement of resistivity and temperature coefficient of resistivity of metallic thin films with the transient hot-strip methodThin Solid Films, 1982
- Determination of the thermal-conductivity tensor and the heat capacity of insulating solids with the transient hot-strip methodJournal of Applied Physics, 1981
- Transient hot-strip method for simultaneously measuring thermal conductivity and thermal diffusivity of solids and fluidsJournal of Physics D: Applied Physics, 1979