STATISTICAL ANALYSIS OF ATOM-PROBE DATA (I) : DERIVATION OF SOME FINE-SCALE FEATURES FROM FREQUENCY DISTRIBUTIONS FOR FINELY DISPERSED SYSTEMS

1 November 1988

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 49 (C6) , C6-433
https://doi.org/10.1051/jphyscol:1988674

Abstract

A statistical model has been developed in order to predict the concentration histograms which are used in atom-probe analyses. This method allows theoretical distributions to be calculated for finely dispersed systems containing spherical particles. Some statistical methods are proposed for the interpretation of experimental histograms

Keywords

MODEL
EXPERIMENTAL
THEORETICAL
SPHERICAL
FREQUENCY
STATISTICAL
ATOM PROBE
HISTOGRAMS
FINELY DISPERSED

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