Multi-state homogeneous Markov models in reliability analysis
- 1 January 1980
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 20 (6) , 875-880
- https://doi.org/10.1016/0026-2714(80)90011-6
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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