Frequency dependent effective masses in Si inversion layers at metallic densities
- 1 August 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 58 (1) , 185-186
- https://doi.org/10.1016/0039-6028(76)90133-3
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Spectroscopy of surface space charge layersSurface Science, 1976
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- Frequency-Dependent Cyclotron Effective Masses in Si Inversion LayersPhysical Review Letters, 1975
- Theory of Cyclotron Resonance Lineshape in a Two-Dimensional Electron SystemJournal of the Physics Society Japan, 1975
- Effective Mass andFactor of Interacting Electrons in the Surface Inversion Layer of SiliconPhysical Review Letters, 1975
- Electron-Electron Interactions Continuously Variable in the RangePhysical Review Letters, 1972
- Cyclotron Resonance and de Haas-van Alphen Oscillations of an Interacting Electron GasPhysical Review B, 1961