Method for the Reduction of Photothermal Deflection Spectroscopy Data Taken on Amorphous Silicon (a-Si:H)
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
Photothermal deflection spectroscopy (PDS) is a sensitive method used to measure weak optical absorption of sub-bandgap radiation. A method utilizing Fourier transformation is presented which allows removal of optical interference effects and noise which is typically present in PDS data taken on a-Si:H, yet leaves the underlying PDS spectra undistorted. The method greatly facilitates comparison of PDS spectra taken on different samples, and simplifies further analysis. Examples using a-Si samples produced under different deposition conditions are presented to demonstrate the utility of the method.Keywords
This publication has 3 references indexed in Scilit:
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- Optical absorption spectra of surface or interface states in hydrogenated amorphous siliconApplied Physics Letters, 1983
- Photothermal deflection spectroscopy and detectionApplied Optics, 1981