Polarimetric Methods for the Determination of the Refractive Index and the Thickness of Thin Films on Glass

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Abstract
A general method, and various modifications thereof, are developed for the determination of the thickness and refractive index of thin films on glass from polarimetric measurements of the reflected light, using plane polarized incident light. The mathematical problem involved cannot be solved in explicit form but, as shown by numerical examples, exact results can be obtained by graphical interpolation.
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