Transmission electron diffraction study of C70 phase transformation at low temperature
- 7 September 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (10) , 1171-1173
- https://doi.org/10.1063/1.107636
Abstract
C70 grown on a NaCl substrate is observed by transmission electron microscopy (TEM) at low temperature (104 K). New spots that appear reproducibly in the electron diffraction (ED) at low temperature can be indexed as (m±1/2, n±1/2, 0) (m, n: integer) in a [001]hcp projection. The lattice constant a is lower at low temperature and the reduction ratio is a104 K/a300 K=1.02/1.06 nm=0.96±0.02, which is much lower than the value reported for C60. The ED of the low-temperature phase is observed below about 260 K, and an intermediate state is also detected in this temperature range.Keywords
This publication has 11 references indexed in Scilit:
- Sound velocity and attenuation in single-crystalPhysical Review Letters, 1992
- The structure of the C70 moleculeNature, 1992
- Molecular-dynamics investigation of orientational freezing in solidPhysical Review B, 1992
- Orientational Disorder in Solvent-Free Solid C 70Science, 1991
- Photophysical properties of solid films of fullerene, C60Journal of Physics: Condensed Matter, 1991
- Transmission electron microscopy of chromatographically purified solid state C60 and C70Chemical Physics Letters, 1991
- Molecular dynamics and the phase transition in solidPhysical Review Letters, 1991
- Structures and vibrational frequencies of carbon molecules (C60, C70, and C84)The Journal of Physical Chemistry, 1991
- Orientational ordering transition in solidPhysical Review Letters, 1991
- Prediction of fullerene packing in C60 and C70 crystalsNature, 1991