IDS 5000: An integrated diagnostic system for VLSI

• 31 December 1987
• journal article
• Published by Elsevier in Microelectronic Engineering
• Vol. 7  (2-4) , 339-342
• https://doi.org/10.1016/s0167-9317(87)80029-1

Abstract

Keywords

• IDS
• CIRCUITS
• IMPLEMENTATION
• BEAM
• VLSI
• FAMILIAR
• SCHEMATIC
• PROBER
• WORKSATION