Influence of memory propagation on phase-resolved stochastic behavior of ac-generated partial discharges

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Abstract
Using measurements of phase-restricted conditional partial-discharge pulse-amplitude and phase distributions, it is shown for the first time that the stochastic properties of a dielectric-barrier type of partial discharge generated by an ac voltage are significantly influenced by memory associated with charge deposited on the dielectric surface by preceding discharge events. This memory effect must be considered in any attempt to interpret results of phase-resolved partial-discharge measurements.